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> Mosaid MS2200 + M22110 memory tester system
Mosaid MS2200 + M22110 memory tester system
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Mosaid MS2200 + M22110 Memory Tester System
Unit Included: Mosaid MS2200 and Mosaid M22110. you will get what you see in the pictures
Descriptions and features:
-The interaction of photon radiation with semiconductor memories is known to corrupt data stored within by a 'bit-flip' process. Using a MOSAID MS2200 memory tester system, experiments were carried out to determine the number and location of these errors for two DRAMs and one SRAM exposed to LINAC and 60Co sources. The results showed that the errors are not, in general, randomly located and are highly dependent on chip architecture. This is particularly true for the DRAMs where the bits adjacent to decoder and ground lines were observed to be the first to flip.
-Semiconductor devices; Computer storage devices; Random access computer storage; Electrons; Linear accelerators; Binary digits; Photons; Nuclear radiation; Error analysis; Gamma rays; Real time operations; Dose rate; Computer architecture; MOSAID MS2200
Australia + New Zealand + Taiwan fixed rate: US Dollars.
Canada + Alaska + Hawaii fixed rate: $ US Dollars.
United Kingdom + Sweden fixed rate: $ US Dollars.
Belgium + France + Germany + Spain + Italy + Switzerland + Netherlands fixed rate: $ US Dollars.
7 Days Full Warranty: The items are 7 days warranty unless specified in description.
